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MEMES

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윌테크놀러지의 mems
윌테크놀러지의 첨단 기술

윌테크놀러지의 첨단 기술

This is applicable to wafer test for CIS image and DRAM chips because signal noise is lower and electrical characteristics is stable, where the needles are generated from Si wafers which have high density needle array as a result of semiconductor lithography process.

윌테크놀러지의 첨단 기술

윌테크놀러지의 첨단 기술

  • Optimum design for preventing yield drop
  • Full wafer contact for 300mm wafer test
  • Possibility of wafer test of DDR2, DDR3,
    and GDDR5 chips



윌테크놀러지의 첨단 기술

  • Realized clock speed more than 1Gbps
  • Cost reduction with multi-parallel test up
    to 32 chips
  • Enabled multi-functional tests with both
    logic and image device





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