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PROBE CARD

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윌테크놀러지의 PROBE CARD
윌테크놀러지의 첨단 기술

윌테크놀러지의 첨단 기술

윌테크놀러지의 첨단 기술

A probe card has been used to test chip to pass or not by applying signals and powers to each chip during the process of Si wafer, which is composed of PCB interfacing of signal propagation, and pin block contacting directly with pads on a chip.
It is a test part to be used from in the wafer process until in the package process both memory and LSI semiconductor fields.



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윌테크놀러지의 첨단 기술


We have accumulated the variety of know-hows in the probe card business, especially, display driver IC test in system LSI field, are focusing our capability in order to enhance the profit by increasing productivity of chip makers via technology applications to memory semiconductor manufacturing beyond system LSI manufacturing.


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