WILLTECHNOLOGY – Wafer Inspection Leading Lab

68

Projects Patent

97

Happy Clients

225

Members

What We Do

PROBE CARD

MEMS Vertical
[Application Processor]

MEMS Cantilever
[CMOS Image Sensor]

Epoxy Cantilever
[Display Driver IC]

Socket Probe Card
[Power Management IC]

PCB Test Jig / Fixture
[IC Package Substrate]

Final Test(FT) – Epoxy Cantilever
[DDIC COF Package]

Recruitment

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